Bsi bs en 62149 7 2012

FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES – PERFORMANCE STANDARDS – Part 7: 1 310-nm discrete vertical cavity surface emitting laser devices 1 Scope This part of IEC 62149 covers the p

Terms and definitions

For the purposes of this document, the following terms and definitions apply

NOTE The following terms are defined for the specific characteristics of vertical cavity surface emitting laser devices

3.1.1 modulation speed digital modulation speed with an optimum modulation amplitude between the operating current and threshold current level

3.1.2 multimode cross-section transverse mode of the laser beam profile with mode number greater than one

The intensity profile of a multi-mode laser beam features multiple spots, in contrast to a single-mode laser, which has a transverse mode cross-section characterized by a single circular spot.

The peak central laser wavelength of a vertical cavity surface emitting laser (VCSEL) device is determined under normal operating conditions, as outlined in the device's sectional specifications.

3.1.4 submount substrate upon which a laser is mounted for assembly into the further packaging

3.1.5 transverse mode cross-sectional profile of the optical beam intensity at the laser output of the VCSEL

Note 1 to entry: Depending on the mode status between multimode and single-mode, the package type of the VCSEL devices is also defined

VCSEL device with a monitor photodiode

VCSEL packaged device with a monitor photodiode

VCSEL device without a monitor photodiode

VCSEL packaged device without a monitor photodiode

Symbols and abbreviated terms

V f forward voltage at operating current

P o continuous laser output power (at connector output or pigtailed fibre output for packaged types)

∆ λ T / ∆ T wavelength change over temperature θ beam divergence at 1/e 2 intensity t r /t f rise and fall time from 20 % to 80 % of the peak intensity

C capacitance of the VCSEL chip

∆ λ spectral width, RMS (at static condition) for multimode VCSELS, -20 dB for single-mode VCSELs RIN relative intensity noise

Absolute limiting ratings

Absolute limiting ratings indicate that short-term exposure to maximum or minimum values will not cause catastrophic damage, provided that each parameter is considered in isolation and all other parameters remain within normal performance ranges It is important to note that the limiting value of more than one parameter should not be applied simultaneously The absolute maximum ratings for subcategorized types, including E1, E3, E10, E40 BLR4, FC1GB, FC2GB, FC4GB, and FC8GB, related to signaling speeds, are detailed in Annexes A through D, based on the transverse mode of the VCSELs and the packaging of the monitor photodiode.

Operating environment

The operating environment of all the subcategorized types of the 1 310 nm VCSEL is specified in Table 2

Functional specification

The functional specifications for various subcategories, including E1, E3, E10, E40BLR4, FC1GB, FC2GB, FC4GB, and FC8GB, detailing signaling speeds and application areas, are provided in Annexes A through D These specifications are categorized based on the transverse mode of the VCSELs, distinguishing between multimode and single-mode, as well as the packaging status of the monitor photodiode.

Diagrams

Diagrams of all the VCSEL device types are included in Annexes A through D

General

Initial characterization and qualification will occur once the build standard is finalized Ongoing qualification maintenance is conducted through regular testing programs, with all tests performed under standard conditions of 25 °C ± 2 °C, unless specified otherwise.

Characterization testing

Characterization will be conducted on a minimum of 20 products sourced from at least three distinct manufacturing lots The laser diode's characteristics and conditions will be evaluated at the specified operating temperature and current to ensure compliance with the functional specifications outlined in section 4.3.

Performance testing

Performance testing is undertaken when characterization testing is complete The performance test plan and recommended performance test failure criteria are specified in Annexes A through D, depending on the device types

General safety

All products meeting this standard shall conform to IEC 60950-1.

Laser safety

The fibre optic transmitter and transceiver utilizing the specified laser diode will be certified as class 3R lasers under all operational conditions, including single fault scenarios, whether connected to a fibre or exposed in an open bore Additionally, these devices will comply with the IEC 60825-1 standard.

Laser safety standards mandate that manufacturers supply detailed information regarding their laser products, including safety features, labeling, usage, maintenance, and service This documentation must clearly outline the requirements and usage restrictions for the host system to ensure compliance with safety certifications.

Electromagnetic compatibility (EMC) requirements

Products outlined in this specification must meet electromagnetic compatibility (EMC) requirements for both emission and immunity, tailored to their specific installation or integration environments IEC Guide 107 offers guidance for drafting these EMC requirements, while recommendations for electrostatic discharge (ESD) are currently being developed.

Specifications for multimode 1 310-nm VCSEL device without a monitor photodiode (Case a)

Absolute limiting ratings indicate that short-term exposure to maximum or minimum values will not cause catastrophic damage, as long as each limiting parameter is considered individually and all other parameters remain within normal performance ranges It is important to note that exceeding the limiting value of multiple parameters simultaneously should not be assumed For detailed information, refer to Table A.1.

Continuous forward current I FLD 15 mA

The requirements of 4.2 shall be met

Tables A.2 and A.3 outline the operating conditions and functional specifications for multimode 1 310-nm VCSEL devices, which support signaling speeds of 1.25 GBd and 3.125 GBd, without the use of a monitor photodiode.

Table A.2 – Operating conditions for functional specification

Operating forward current I op 12 mA

Laser wavelength (for single channel uses) λ p 1 270 1 355 nm CW, E1A1a,

Laser wavelength (for four WDM channel uses) λ p_C0 1 269,0 1 282,4 nm CW, E3A1a,

E3A1b Spectral width, RMS (for single channel uses) ∆λ 4 nm CW

Spectral width, RMS (for four WDM channel uses) ∆λ 0,62 nm CW E3A1a,

Slope efficiency (at I op in a TO package) η 0,05 0,3 mW/mA

Slope efficiency (at I op in a TOSA or pigtailed package) η 0,03 0,2 mW/mA

Continuous laser output power (at I op in a

Wavelength change over temperature ∆λ/∆T 0,2 nm/°C

Rise and fall time (20 % – 80 %) t r /t f 260/260 ps E1A1a,

Relative intensity noise RIN -120 dB/Hz a

The series resistance temperature coefficient, denoted as \(\Delta R_S / \Delta T\), is typically -4000 ppm/°C for a 1 GHz bandwidth and specified optical power This indicates that the series resistance of laser diodes decreases with increasing temperature, resulting in a negative thermal dependence.

Performance testing is undertaken when characterization testing is complete A performance test plan is shown in Table A.4 and recommended performance test failure criteria in Table A.5

T B =Tstg max Number of cycles = 100

85 ± 5 % RH at the maximum temperature

1 hour minimum duration at extremes

Temperature: at least two test temperatures: φe specified, constant power

4 Rapid change of temperature IEC 60749-11 ΔT0 °C, Temperature change time < 10 s, dwell time > 2 min temperature reach time < 5 min

5 ESD IEC 60749-26 Human body model, positive and negative voltage pulses with a pulse interval of 300 ms

6 Internal moisture IEC 60749-7 ≤ 5 000 × 10 −6 water vapour 11 a Applied to fibre pigtailed packages b These parameters can be determined from negotiation between manufacturer and user c Number of samples

Table A.5 – Recommended performance test failure criteria

Devices Parameter Failure criterion Measurement condition

Slope efficiency Forward voltage Kinks in L/I curve

Kink-free within 1,2 × P nom (linearity change ≤10%) a

T op min, 25 °C, T op max Laser package Operating current

Fibre or connector output power Kinks in L/I curve

Kink-free within 1,2 × P nom (linearity change ≤10 %) a

I mon set to initial value

At rated power level a Change of pre- and post-test values in the DS

Specifications for multimode 1 310-nm VCSEL device with a monitor photodiode (Case b)

Absolute limiting ratings indicate that a product can withstand maximum or minimum conditions without catastrophic damage for short durations, as long as each limiting parameter is considered individually and all other parameters remain within normal performance ranges It is important to note that exceeding the limiting value of more than one parameter simultaneously should not be assumed For detailed information, refer to Table B.1.

Maximum forward current I mF 2 mA

Tables B.2 and B.3 outline the operating conditions and functional specifications for multimode 1 310 nm VCSEL devices, which support signaling speeds of 1.25 GBd and 3.125 GBd, including a monitor photodiode under specified operating conditions.

Table B.2 – Operating conditions for functional specification

Laser wavelength (for single channel uses) λ p 1 270 1 355 nm CW, E1A1a,

Laser wavelength (for four WDM channel uses) λ p_C0 1 269,0 1 282,4 nm CW, E3A1a,

E3A1b Spectral width, RMS (for single channel uses) ∆λ 4 nm CW

Spectral width, RMS (for four WDM channel uses) ∆λ 0,62 nm CW E3A1a,

Rise and fall time t r /t f 260/260 ps E1A1a,

Relative intensity noise RIN -120 dB/Hz a

Series resistance temperature coefficient ∆R S /∆T -4 000 ppm/°C b

Dark current I mR0 100 nA P op = 0 mW,

For a bandwidth of 1 GHz, the optical power is usually specified as a negative value The series resistance of laser diodes tends to decrease with rising temperatures, resulting in a typically negative thermal-dependent parameter This information is relevant only for VCSELs equipped with a monitor photodiode at a standard room temperature of 25 °C Additionally, it reflects the total capacitance between the anode and cathode terminals of the monitor photodiode subassembly.

Performance testing is undertaken when characterization testing is complete A performance test plan is shown in Table B.4 and recommended performance test failure criteria in Table B.5

T B =T stg max Number of cycles = 100

Temperature: at least two test temperatures: φ e specified, constant power

Temperature: at least two test temperatures:

4 Rapid change of temperature IEC 60749-11 ΔT0 °C, Temperature change time < 10 s, dwell time > 2 min temperature reach time < 5min

6 Internal moisture IEC 60749-7 ≤ 5 000 ×10 −6 water vapor 11 a Applied to fibre pigtailed packages b These parameters can be determined from negotiation between manufacturer and user c Number of samples

Table B.5 – Recommended performance test failure criteria

Kink-free within 1,2 × P nom (linearity change ≤10%) a

Photodiode Dark current USL or 10 nA increase 25 °C

Tracking ratio (I mon / P fibre ) Photodiode dark current

< LSL ≥ USL USL or 10 nA increase a

Imon set to initial value

25 °C a Change of pre- and post-test values in the DS

Specifications for single-mode 1 310-nm VCSEL device without a monitor photodiode (Case c)

Absolute limiting ratings indicate that short-term exposure to maximum or minimum values will not cause catastrophic damage, as long as each limiting parameter is considered individually and all other parameters remain within normal performance ranges It is important to note that exceeding one limiting value simultaneously is not advisable For detailed information, refer to Table C.1.

Tables C.2 and C.3 outline the operating conditions and functional specifications for single-mode 1,310 nm VCSEL devices, which support signaling speeds of 1.0625 GBd, 1.25 GBd, 3.125 GBd, 4.25 GBd, 8.5 GBd, and 10 GBd, all without a monitor photodiode.

Table C.2 – Operating conditions for functional specification

Laser wavelength (for single channel uses) λ p

Laser wavelength (for four WDM channel uses with 3.125 GBd/each) λ p_C0 1 269,0 1 282,4 nm CW,

Laser wavelength (for four WDM channel uses with 10.3125 GBd/each) λ p_L0 1 264,5 1 277,5 nm CW,

E40BLR4 Spectral width at -20 dB (for single channel uses) ∆λ 1 nm CW

Spectral width at -20 dB (for four WDM channel uses) ∆λ 0,62 nm CW,

Rise and fall time (20% to 80%) t r /t f

FC8GB E10BLR, E10BLW, E40BLR4

Side mode suppression ratio SMSR 30 dB at T 0 and I op

The series resistance temperature coefficient (\(\Delta R_S / \Delta T\)) is -4000 ppm/°C, indicating that the series resistance of laser diodes decreases with increasing temperature For accurate assessments, it is essential to consider eye diagram masks and transmitter dispersion penalty (TDP) as reliable guidelines, particularly for a 1 GHz bandwidth and specified optical power, which is typically a negative value.

Performance testing is undertaken when characterization testing is complete A performance test plan is shown in Table C.4 and recommended performance test failure criteria in Table C.5

T B =Tstg max Number of cycles = 100

4 Rapid change of temperature IEC 60749-11 ΔT0 °C, Temperature change time < 10 s, dwell time> 2 min temperature reach time < 5 min

6 Internal moisture IEC 60749-7 ≤ 5 000 × 10 −6 water vapor 11 a Applied to fibre pigtailed packages b These parameters can be determined from negotiation between manufacturer and user c Number of samples

Table C.5 – Recommended performance test failure criteria

Imon set to initial value

At rated power level a Change of pre- and post-test values in the DS

Specifications for single-mode 1 310-nm VCSEL device with a monitor photodiode (Case d)

Absolute limiting ratings indicate that a product can withstand maximum or minimum conditions without catastrophic damage for short durations, as long as each limiting parameter is considered individually and all other parameters remain within normal performance ranges It is important to note that exceeding the limiting value of more than one parameter simultaneously should not be assumed For reference, absolute limiting ratings are detailed in Table D.1.

Maximum forward current I mF mA

Tables D.2 and D.3 outline the operating conditions and functional specifications for single-mode 1,310 nm VCSEL devices, which support signaling speeds of 1.0625 GBd, 1.25 GBd, 3.125 GBd, 4.25 GBd, 8.5 GBd, and 10 GBd, including a monitor photodiode under specified operating conditions.

Table D.2 – Operating conditions for functional specification

Laser wavelength (for single channel uses) λ p

Laser wavelength (for four WDM channel uses with 3,125 GBd/each) λ p_C0 1 269,0 1 282,4 nm CW,

Laser wavelength (for four WDM channel uses with 10,3125 GBd/each) λ p_L0 1 264,5 1 277,5 nm CW,

E40BLR4 Spectral width at -20 dB (for single channel uses) ∆λ 1 nm CW

Spectral width at -20 dB (for four WDM channel uses) ∆λ 0,62 nm CW,

FC8GB E10BLR, E10BLW, E40BLR4

Side mode suppression ratio SMSR 30 dB at T 0 and I op

> 2x I th Series resistance temperature coefficient ∆R S /∆T -4 000 ppm/ o C c

Dark current I mR0 100 nA P op = 0 mW,

When evaluating optical systems, it is essential to consider eye diagram masks and transmitter dispersion penalty (TDP) as accurate guidelines For a bandwidth of 1 GHz and specified optical power, typically a negative value, the series resistance of laser diodes decreases with increasing temperature, resulting in a thermal-dependent parameter that is also generally negative This information specifically pertains to VCSELs equipped with a monitor photodiode at a room temperature of 25 °C, indicating the total capacitance between the anode and cathode terminals of the monitor photodiode subassembly.

Performance testing is undertaken when characterization testing is complete A performance test plan is shown in Table D.4 and recommended performance test failure criteria in Table D.5

Temperature: T =Tstg max Duration: 1 000 h Temperature: T =Tstg min Duration: > 2 000 h Temperature: TA =Tstg min

TB =Tstg max Number of cycles = 100

Temperature: at least two test temperatures:

4 Rapid change of temperature IEC 60749-11 ΔT0 °C, Temperature change time < 10 s, dwell time > 2 min temperature reach time < 5 min

6 Internal moisture IEC 60749-7 ≤ 5 000 ×10 −6 water vapor 11 a Applied to fibre pigtailed packages b These parameters can be determined from negotiation between manufacturer and user c Number of samples

Table D.5 – Recommended performance test failure criteria

Photodiode Dark current USL or 10 nA increase 25 °C

Tracking ratio (I mon / P fibre ) Photodiode dark current

< LSL ≥ USL USL or 10 nA increase a

Life test temperature Imon set to initial value

25 °C a Change of pre- and post-test values in the DS

IEC 60191 (all parts), Mechanical standardization of semiconductor devices

IEC 60747-5-1, Discrete semiconductor devices and integrated circuits – Part 5-1: Optoelectronic devices – General

IEC 60793-2, Optical fibre – Part 2: Product specifications

IEC 60874 (all parts), Connectors for optical fibres and cables

IEC 61280-1-3, Fibre optic communication subsystem test procedures – Part 1-3: General communication subsystems – Central wavelength and spectral width measurement

IEC 62007-1, Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential ratings and characteristics

IEC 62007-2, Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods

IEC 62148-1, Fibre optic active components and devices – Package and interface standards – Part 1: General and guidance

IEC 62149-1, Fibre optic active components and devices – Performance Standards Part 1: General and guidance

IEC 62149-4, Fibre optic active components and devices – Performance standards – Part 4:

1 300 nm fibre optic transceivers for Gigabit Ethernet application

IEEE 802.3-2002, Local and metropolitan area networks – Carrier Sense Multiple Access with Collision Detection (CSMA/CD) access method and Physical layer specifications: Clause 38

Physical Medium Dependent (PMD) sublayer and baseband medium, type 1000BASE-LX (Long Wavelength Laser) and 1000BASE-SX (Short Wavelength Laser), July 1988

The IEEE 802.3-2005 standard outlines the specifications for telecommunications and information exchange in local and metropolitan area networks, focusing on the Carrier Sense Multiple Access with Collision Detection (CSMA/CD) access method Section Four encompasses Clauses 44 to 54 and includes Annexes 44A to 50A, detailing specific requirements for the physical layer and access methods.

The IEEE P802.3ba-2009 standard outlines the specifications for telecommunications and information exchange in local and metropolitan area networks It focuses on the Carrier Sense Multiple Access with Collision Detection (CSMA/CD) access method and physical layer specifications This amendment details the media access control parameters, physical layers, and management parameters necessary for 40 Gb/s and 100 Gb/s operation.

INCITS 450-2009 FIBRE CHANNEL-Physical Interface-4 (FC-PI-4)

INCITS/Project 2118-D/Rev1.00 – 2008.09.25, FIBRE CHANNEL Physical Interface-5 (FC-PI-5)

Tiêu đề	Fibre optic active components and devices — Performance standards Part 7: 1 310 nm discrete vertical cavity surface emitting laser devices
Trường học	British Standards Institution
Chuyên ngành	Standards Publication
Thể loại	Standard
Năm xuất bản	2012
Thành phố	Brussels

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Số trang	38
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