15 Annex C normative Required reliability qualification tests for passive optical components used in category O, uncontrolled environments sequential .... 18 D.1 Informative and optional
Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62005-1, as well as the following apply
RQST test which applies a mechanical, electrical, optical, environmental or other stress or any combination of the above to the DUT
Note 1 to entry: This note applies to the French language only
3.1.2 lot tolerance per cent defective
LTPD level of quality that is unsatisfactory and should be rejected by the sampling plan
Note 1 to entry: This note applies to the French language only.
Abbreviations
FMEA Failure mode and effect analysis
LTPD Lot tolerance per cent defective
RQST Reliability qualification stress test
VIPA Virtually imaged phased array
DUT
The standard requires a clear definition of the specific passive optical component it pertains to Additionally, the devices under test (DUTs) must be randomly selected from a broader sample population to ensure they accurately represent the devices intended for customer shipment.
In a Reliability Qualification Standard (RQS) program, while a uniform set of Devices Under Test (DUTs) is preferred, practical limitations may necessitate the use of different DUTs In such instances, known as 'read across' or 'test by similarity', it is essential to clearly describe the specific products utilized in each test Comprehensive justification for each 'read across' and 'test by similarity' must be documented Furthermore, it is important to define the manufacturing maturity level of each DUT type, indicating whether the product is fully in production with complete documentation or still in development with substantial engineering support.
Product family
When a specific model within a product family is qualified, the qualification can be extended to the entire family, provided that the device under test (DUT) is the model with the highest specifications Only those models with specifications that are equal to or lower than the tested device can be considered qualified This principle also applies when test results are extended to products that are less complex.
EXAMPLE Qualification of 1 x 8 splitters may be justified by qualification of 1 x 16 splitters if the same technology is used
In both cases, a technical argumentation is required to justify the qualification by similarity.
Service environments
The performance requirements for passive fibre optic components are defined in IEC 61753-1 The relevant service environments for this standard are as follows:
Testing under more severe conditions is considered sufficient to meet the criteria for less severe conditions, thereby avoiding unnecessary redundancy in testing It is important to note that testing in environments more severe than those listed in Table 1 is not included in the current version of this RQST.
General
The article outlines three types of tests specified in Annexes A, B, C, and D: required tests, informative tests, and optional tests Required tests, essential for each performance category, are detailed in Annex A for controlled environments and in Annexes B and C for uncontrolled environments These tests must be conducted, measurements recorded, and data evaluated against pass/fail criteria.
Annex D outlines the optional and informative tests for each performance category While informative tests must be conducted and measurements reported, the pass/fail criteria are not applicable Optional tests, though not mandatory, can be performed, and if they are, the necessary measurements must be taken and evaluated against the pass/fail criteria.
To ensure the reliability of passive optical components and modules, it is essential to validate their failure modes through failure mode and effect analysis (FMEA) This involves comparing the test items outlined in FMEA with those in Annexes A, B, C, or D If any required test items are not addressed in these annexes, additional tests specified in Annex E must be conducted.
Quantity of the DUTs
The number of Device Under Test (DUT) units must be established and should not fall below the minimum requirement Furthermore, it is permissible to include additional DUTs in a test at any point to ensure that the necessary Lot Tolerance Percent Defective (LTPD) is achieved.
Sequence
The test sequence must be established, allowing all tests to be conducted in parallel, series, or a combination of both, except for the mechanical shock and vibration tests, which must be performed in series, with the mechanical shock test occurring first.
Acceptance criteria
The acceptance criteria for testing must be clearly defined, ensuring that the number of test failures does not exceed the allowable limits set by the Lot Tolerance Percent Defective (LTPD) to qualify the test as a pass.
Test methods
Each test must have a clearly defined method, as outlined in the IEC 61300 series In cases where the IEC 61300 test method is unavailable, alternative test methods may be specified If an undefined test method is employed, it must be technically justified and documented in the RQST.
Severity
The severity and duration of the variables in the tests shall be clearly defined
General
The general standard outlines limited measurement requirements due to the diverse range of Devices Under Test (DUTs) and their varying performance parameters It is essential that the measurement selection for a qualified product is justified and fully adheres to the product's IEC performance specification.
Measurements
The criteria for assessing the pass or fail status of a Device Under Test (DUT) will be clearly defined, encompassing both absolute values and variations in those values.
Pass/fail criteria
The criteria for pass or fail in each measurement must be clearly defined and justified, ensuring that they meet or exceed the end-of-life performance conditions outlined in the applicable IEC performance standard.
In the event that an IEC performance document does not exist, the product’s publicly advertised data sheet may be substituted.
Measurement methods
When an IEC measurement standard is available, it must be utilized for measurements In the absence of such a standard, recognized industry techniques may be employed, provided they are well-defined.
Required leak rate and residual gas analysis measurements
Hermetic devices must achieve a leak rate of \$5 \times 10^{-8} \text{ atm cm}^3/\text{s (He)}\$ following all tests, with the exception of electrostatic discharge (ESD) and fibre or cable retention tests, where the hermetic seal is not subjected to stress.
The water vapour content as measured by residual gas analysis shall be ≤ 5 000 × 10 -6 for hermetic devices only
The water vapour content as measured by residual gas analysis shall be measured and reported after the damp heat (steady state) test for hermetic devices only
A comprehensive report must include essential information such as a table detailing the test name, longevity, severity, number of devices tested, and failures It should provide a full description of the Device Under Test (DUT) and outline the test procedure Additionally, the report must justify any read 'acrosses' or 'tests by similarity' and specify the sequence of tests for each group of parts It should also describe the service environment for which qualification is claimed and reference or fully describe the test method used Justifications for all reported measurements and pass/fail outcomes are necessary, along with tables, charts, or other means to verify that requirements were met, such as a table of minimum and maximum values or a chart illustrating parameters over time with clearly marked pass/fail criteria.
Required reliability qualification tests for passive optical components used in category C, controlled environments
The required reliability qualification tests for passive optical components used in category C, controlled environments, are summarized in Table A.1
Table A.1 – Required reliability qualification tests for passive optical components used in category C, controlled environments (1 of 2)
NA for connector, plug and receptacle styles
Number of shocks: 5 times/dir,
6 directions Shock level: 4,9 N Duration: 1 ms or Drop height: 1,8 m Number of drops per three mutually perpendicular axes: 8 Number of repetitions of impact test cycle: 5
Acceleration: 20 G Frequency: 20 Hz to 2 000 Hz Duration: 4 min/cycle, 4 cycle/axis or Acceleration: 20 G or 1,52 mm}
Frequency: 10 Hz to 2 000 Hz Duration: Sweep cycle performed 12 times in each of three mutually perpendicular directions
Temperature: –40 °C to 70 °C Dwell time: ≥ 15 min
References/ Remarks Required tests ( continued)
–40 °C or min storage T Humidity: Uncontrolled
NOTE 1 G1-1 means group of parts number 1, test number 1
NOTE 2 G1-2 means group of parts number 1, test number 2
NOTE 3 P means that this test may be run separately (in parallel) or in any combination of series/parallel with other tests
NOTE 4 The test requirements are in line with the test requirements from GR-1221-CORE, Issue 3, Generic Reliability Assurance Requirements for Passive Optical Components
Required reliability qualification tests for passive optical components used in category U, uncontrolled environments
The required reliability qualification tests for passive optical components used in category U, uncontrolled environments, are summarized in Table B.1
Table B.1 – Required reliability qualification tests for passive optical components used in category U, uncontrolled environments
Test name Requirements Sequentia l/parallel LTPD
6 directions, 1 ms pulse half sine wave pulse G1-1 20 11 0 IEC 61300-2-9
0,2 N above 60 Hz, sinusoidal 1,52 mm below 60 Hz, 10 Hz to
∆T = 100 °C, 0 °C to 100 °C, 5 min dwells, ≤ 10 s transfer time, liquid to liquid P 20 11 0 IEC 61300-2-47
(if applicable) 6 s , 245 °C, no steam ageing P 20 11 0
Dry heat – high temperature storage
2 000 h , 85 °C at < 40 % RH or maximum advertised storage temperature
Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
2 000 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
500 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
500 cycles from –40 °C to +85 °C, dwell time ≥ 15 min, ramp 1 °C/min
Measurement of IL and RL before the test, during the test at a maximum interval of 10 min and after the test
ESD sensitive component) HBM to failure P NA 6 0 IEC 60749-26
Required reliability qualification tests for passive optical components used in category O, uncontrolled environments (sequential)
The required reliability qualification tests for passive optical components used in category O, uncontrolled environments (sequential), are summarized in Table C.1
Table C.1 – Required reliability qualification tests for passive optical components used in category O, uncontrolled environments (sequential) (1 of 2)
Test name Requirements Sequential parallel /
6 directions, 1 ms pulse half sine wave pulse G1-1 20 11 0 NOTE 1
0,2 N above 60 Hz, sinusoidal 1,52 mm below 60 Hz, 10 Hz to
∆T = 100 °C, 0 °C to 100 °C, 5 min dwells, ≤ 10 s transfer time, liquid to liquid P 20 11 0 NOTE 1
NOTE 2 Only for components including electrical circuits
Dry heat – high temperature storage
2 000 h, 85 °C at < 40 % RH or maximum advertised storage temperature
Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
2 000 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
500 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
–40 °C or min storage T Humidity: Uncontrolled
2 000 h Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
500 cycles from –40 °C to +85 °C, dwell time ≥15 min, ramp 1 °C/min
Measurement of IL and RL before the test, during the test at a maximum interval of 10 min and after the test
ESD sensitive component) HBM to failure P NA 6 0 NOTE 1
NOTE 1 The test requirements are in line with the test requirements from GR-1221-CORE, Issue 3, Generic Reliability Assurance Requirements for Passive Optical Components
NOTE 2 The test requirements are in line with the test requirements from MIL-STD-883, Method 2003,
Informative and optional reliability qualification tests for passive optical components used in category C, category U and category O environments
Informative and optional reliability qualification tests for passive optical
components used in category C, controlled environments
The informative and optional reliability qualification tests for passive optical components used in category C, controlled environments, are summarized in Table D.1
Table D.1 – Informative and optional reliability qualification tests for passive optical components used in category C, controlled environments (1 of 2)
Temperature: –40 °C to 70 °C Dwell time: ≥ 15 min
–40 °C or min storage T Humidity: Uncontrolled
NA for connector plug and adaptor styles
NA for connector plug and adaptor styles
∆T0 °C (0 °C à 100 °C) Dwell times: ≥ 5 min Transfer time: ≤ 10 s Number of cycles: 15
NOTE 2 Only for hermetic sealed
Temperature: 85 ºC Humidity: < 40 % RH Duration: 2 000 h (required test)
NOTE 3 Only for components including electrical circuits
NOTE 2 Only for components including electrical circuits
NOTE 1 P means that this test may be run separately (in parallel) or in any combination of series parallel with other tests
NOTE 2 The test requirements are in line with the test requirements from GR-1221-CORE, Issue 3, Generic Reliability Assurance Requirements for Passive Optical Components
NOTE 3 The test requirements are in line with the test requirements from MIL-STD-883, Method 2003.
Optional reliability qualification tests for passive optical components used in
used in category U, uncontrolled environments
The optional reliability qualification tests for passive optical components used in category U, uncontrolled environments, are summarized in Table D.2
Table D.2 – Optional reliability qualification tests for passive optical components used in category U, uncontrolled environments
Test name Requirements Sequentia l/parallel LTPD
5 000 h, 85 ºC/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
5 000 h, 85 ºC/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
1 000 cycles from –40 °C to +85 °C, dwell time ≥ 15 min, ramp 1ºC/min
Measurement of IL and RL before the test, during the test at a maximum interval of 10 min and after the test
2 000 h, –40 °C or minimum advertised storage conditions Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
Informative reliability qualification tests for passive optical components used
used in category O, uncontrolled environments (sequential)
The informative reliability qualification tests for passive optical components used in category
O, uncontrolled environments (sequential), are summarized in Table D.3
Table D.3 – Informative reliability qualification tests for passive optical components used in category O, uncontrolled environments (sequential)
5 000 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
2 000 h, 85 °C/85 % RH Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
1 000 cycles from –40 °C to +85 °C, dwell time ≥ 15 min, ramp 1 °C/min
Measurement of IL and RL before the test, during the test at a maximum interval of 10 min and after the test
≥ 5 000 h Measurement of IL and RL before the test, during the test at a maximum interval of 60 min and after the test
NOTE The test requirements are in line with the test requirements from GR-1221-CORE, Issue 3, Generic Reliability Assurance Requirements for Passive Optical Components
Annex E provides an informative overview of failure modes and known failure mechanisms for passive optical components, summarized in Table E.1 This table outlines various optical components, their constituent parts, known failure mechanisms, failure modes, degradation factors, relevant tests, and references For instance, in branching devices, specifically the fibre fused type, a common failure mechanism is the fixing point between the fused part and the substrate.
The deterioration of adhesive in fiber fused parts leads to changes in tension, resulting in an increase in polarization-dependent loss (PDL) and alterations in wavelength characteristics Factors such as thermal stress, high humidity, and dry heat, as outlined in IEC 61300-2-18 and IEC 61300-2-19, contribute to these changes Additionally, temperature fluctuations, as specified in IEC 61300-2-22, can cause variations in the refractive index due to stress, further increasing PDL and affecting wavelength characteristics.
Thermal stress and high humidity can significantly impact optical fibers, leading to issues such as increased insertion loss and decreased return loss Standards like IEC 61300-2-18 and IEC 61300-2-19 address damp heat conditions, while IEC 61300-2-22 focuses on temperature changes Mechanical stress from vibrations (IEC 61300-2-1) and shocks (IEC 61300-2-9) can also cause fiber breakage and changes in the refractive index due to OH diffusion, ultimately affecting wavelength characteristics.
High humidityDamp heatIEC 61300-2-19 Pigtail See the last row of this table Planar waveguide type
WaveguideRefractive index change Insertion loss increase PDL increase Wavelength characteristics changing
Mechanical stress (including mechanical stress caused by deformation of adhesive) Thermal stress
VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Connecting point between waveguide and fibre
Dislocation of waveguide and fibre by the deterioration of adhesive Insertion loss increase High humidity High temperature Thermal stress Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22
Ta bl e E 1 ( 2 of 20 ) Optical components Constituent parts Known failure mechanisms Failure modes Degradation factors Relevant tests References Separation of waveguide and fibre by the deterioration of adhesive
Insertion increase Return loss decreaseHigh humidity High temperature Thermal stress
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Pigtail See the last row of this table Fixed attenuator s (plug style)
Film typeFacet of ferruleOptical damage of endfaceAttenuation change Reflection increase High optical powerHigh optical powerIEC 61300-2-14 FilmDeterioration of attenuation by high power
Changes in attenuation and increased reflection can occur due to high optical power, as outlined in IEC 61300-2-14, which also notes that stress-induced changes in the refractive index can lead to increased polarization-dependent loss (PDL) Mechanical and thermal stresses, along with vibrations, are significant factors, as specified in IEC 61300-2-1 and IEC 61300-2-9, while temperature fluctuations are addressed in IEC 61300-2-22 Additionally, deterioration of adhesive at film fixing points can cause dislocation, further impacting performance High humidity and elevated temperatures, including dry heat (IEC 61300-2-18) and damp heat (IEC 61300-2-19), also contribute to these changes, emphasizing the importance of considering environmental factors and material properties, such as those found in metal-doped fiber types.
The optical performance of ferrules can be significantly affected by factors such as endface damage, which leads to increased attenuation and reflection, particularly under high optical power conditions Compliance with standards like IEC 61300-2-14 is crucial, as it addresses issues like the fixing point of doped fibers to ferrules Deterioration of adhesive can cause fiber movement within the ferrule, further impacting performance Additionally, thermal stress, high humidity, and elevated temperatures can exacerbate these issues, as outlined in IEC 61300-2-18 and IEC 61300-2-19.
Ta bl e E 1 ( 3 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References Fixed attenuator s (plug style) (continued)
The optical performance of fiber connections can be significantly affected by various factors, including gap type and the condition of the ferrule facet High optical power can lead to optical damage at the endface, resulting in increased attenuation and reflection, as outlined in IEC 61300-2-14 Additionally, deterioration of adhesive in the gap portion can cause changes in fiber alignment, further impacting attenuation, especially under high humidity and temperature conditions (IEC 61300-2-18 and IEC 61300-2-19) Mechanical and thermal stresses, as well as vibrations, can also contribute to fiber gap changes, leading to attenuation variations (IEC 61300-2-1 and IEC 61300-2-9) Furthermore, bending or breaking of the fiber due to stress can increase reflection and attenuation, emphasizing the importance of proper fiber fixing and adherence to standards such as IEC 61300-2-22.
High optical power can lead to film deterioration, resulting in increased attenuation and reflection changes Factors such as mechanical stress, thermal stress, and vibration, as outlined in IEC 61300-2-1, contribute to these issues Additionally, temperature fluctuations, as specified in IEC 61300-2-22, can further exacerbate the deterioration of adhesive fixing points, causing dislocation High humidity and elevated temperatures, including dry heat (IEC 61300-2-18) and damp heat (IEC 61300-2-19), also play a significant role in affecting optical performance Lastly, the impact of metal-doped fiber types should be considered in relation to these stress factors.
Pigtail See the last row of this table
Ta bl e E 1 ( 4 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References Fixed attenuators (pigtail style) (continued)
The optical performance of fiber optics can be significantly affected by various factors, including gaps in the fiber, which may lead to increased attenuation and reflection, especially under high optical power conditions (IEC 61300-2-14) Deterioration of adhesive in the gap portion can cause changes in fiber alignment, influenced by environmental conditions such as high humidity and temperature (IEC 61300-2-18, IEC 61300-2-19) Mechanical and thermal stresses, along with vibrations, can also contribute to fiber gap changes, resulting in attenuation variations (IEC 61300-2-1) Additionally, improper bending or breakage of the fiber at the fixing portion can further increase attenuation and reflection (IEC 61300-2-14) Misalignment at splice points can lead to fiber breaks and increased insertion loss, exacerbated by mechanical stress, thermal stress, and other factors (IEC 61300-2-1, IEC 61300-2-4, IEC 61300-2-5, IEC 61300-2-7, IEC 61300-2-9, IEC 61300-2-15, IEC 61300-2-18, IEC 61300-2-22, IEC 61300-2-35, IEC 61300-2-6).
Ta bl e E 1 ( 5 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References Fixed attenuators (pigtail style) (continued)
Misalignment splice types can lead to various issues such as increased insertion loss, mechanical stress, and thermal stress Factors like high temperature, high humidity, and vibration can exacerbate these problems Compliance with IEC standards, including IEC 61300-2-1 for retention and IEC 61300-2-4 for torsion/twist, is crucial for ensuring the integrity of fiber optic connections Additionally, considerations for bending moments, shock, torque strength, and temperature changes are essential, as outlined in IEC 61300-2-7, IEC 61300-2-9, IEC 61300-2-15, and IEC 61300-2-22 Proper attention to tensile strength and cable nutation, as specified in IEC 61300-2-6 and IEC 61300-2-35, is vital for maintaining optimal performance in fiber optic systems.
Ta bl e E 1 ( 6 of 20 ) Optical components Constituent parts Known failure mechanisms Failure modes Degradation factors Relevant tests References Pigtail style optical isolators Pigtail style optical circulators
Birefringent crystalDislocation by deterioration of fixed parts (adhesive, solder or welding)
Mechanical and thermal stresses, along with high temperature and humidity, can lead to an increase in insertion loss and a decrease in isolation Vibration and shock, as outlined in IEC 61300-2-1 and IEC 61300-2-9, respectively, contribute to these issues Additionally, changes in temperature, referenced in IEC 61300-2-22, can alter the refractive index, further decreasing isolation These factors can also result in increased polarization-dependent loss (PDL) and polarization mode dispersion (PMD), ultimately leading to potential crystal breakage.
Mechanical stress Thermal stress VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Change of temperature IEC 61300-2-22 AR coating damage Insertion loss increase Reflection increase Thermal stress High temperature High humidity
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22
Ta bl e E 1 ( 7 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References Pigtail style optical isolators Pigtail style optical circulators (continued)
Faraday rotators can experience dislocation due to the deterioration of fixed components such as adhesives, solder, or welding This deterioration can lead to an increase in insertion loss and a decrease in isolation, primarily caused by mechanical and thermal stress Factors such as high temperatures, high humidity, and vibrations can exacerbate these issues, as outlined in various IEC standards including IEC 61300-2-1 for vibration, IEC 61300-2-9 for shock, and IEC 61300-2-18 for dry heat Additionally, changes in temperature (IEC 61300-2-22) can result in alterations to the extinction ratio, further decreasing isolation The consequences of these stresses may include crystal breakage, increased insertion loss, reduced isolation, and heightened polarization-dependent loss (PDL) and polarization mode dispersion (PMD).
Mechanical stress Thermal stress VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Change of temperature IEC 61300-2-22 AR coating damageInsertion loss increase Reflection increase Thermal stress High temperature High humidity
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Permanent magnetFall awayInsertion loss increase Isolation decrease PDL increase
Mechanical stress Thermal stress VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Change of temperature IEC 61300-2-22
Ta bl e E 1 ( 8 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References Pigtail style optical isolators Pigtail style optical circulators (continued)
CollimatorDislocation by deterioration of fixed parts (adhesive, solder or welding)
Insertion loss increases and isolation decreases due to mechanical and thermal stress, particularly under high temperature and humidity conditions Vibration and shock, as outlined in IEC 61300-2-1 and IEC 61300-2-9, respectively, can also contribute to these issues Additionally, dry heat (IEC 61300-2-18) and damp heat (IEC 61300-2-19) can lead to changes in temperature (IEC 61300-2-22) that may damage AR coatings, resulting in increased insertion loss and decreased return loss.
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Lens damageInsertion loss increaseHigh humidityDamp heatIEC 61300-2-19 Pigtail See the last row of this table.
Table E.1 outlines the optical components, specifically focusing on the Wavelength Division Multiplexing (WDM) thin film filter type It identifies known failure mechanisms, including dislocation caused by the deterioration of fixed parts such as adhesives, solder, or welding Additionally, it highlights the associated failure modes, degradation factors, relevant tests, and references for further information.
Insertion loss can increase due to various factors, including mechanical and thermal stress, high temperatures, and high humidity Additionally, vibrations and shocks, as outlined in IEC 61300-2-1 and IEC 61300-2-9, respectively, can further impact performance Conditions such as dry heat (IEC 61300-2-18) and damp heat (IEC 61300-2-19) also contribute to changes in wavelength characteristics Furthermore, temperature fluctuations (IEC 61300-2-22) and thin film degradation can lead to significant increases in insertion loss.
High humidityDamp heatIEC 61300-2-19 CollimatorDislocation by deterioration of fixed parts (adhesive, solder or welding)
Insertion loss can increase due to mechanical and thermal stress, particularly under high temperature and humidity conditions Vibration and shock, as outlined in IEC 61300-2-1 and IEC 61300-2-9, respectively, can also contribute to these issues Additionally, exposure to dry heat (IEC 61300-2-18) and damp heat (IEC 61300-2-19) can lead to changes in temperature (IEC 61300-2-22), resulting in AR coating damage and further increases in insertion and reflection loss.
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Lens damageInsertion loss increaseHigh humidityDamp heatIEC 61300-2-19 Pigtail See the last row of this table
Ta bl e E 1 ( 10 o f 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References WDM (continued)Planar waveguide type (AWG, athermal AWG, interleaver)
WaveguideRefractive index change by stressInsertion loss increase PDL increase Spectrum change
Mechanical stress (including mechanical stress caused by deformation of adhesive) Thermal stress
VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Polymer insertion part for athermalization (polymer insertion type)
Polymer degradation Separation from waveguideInsertion loss increase Wavelength shift Crosstalk increase
High humidity High temperature Thermal stress
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Mechanical part for athermalization (mechanical compensation type)
Adhesive degradation Moving part separationInsertion loss increase Wavelength shift High humidity High temperature Thermal stress Mechanical stress
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Shock IEC 61300-2-1 VibrationIEC 61300-2-9 Connecting point between waveguide and fibre
Dislocation of waveguide and fibre by the deterioration of adhesive Insertion increase High humidity High temperature Thermal stress
Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Separation of waveguide and fibre by the deterioration of adhesive
Insertion increase Return loss decreaseHigh humidity High temperature Thermal stress Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Pigtail See the last row of this table
Ta bl e E 1 (1 1 of 20 ) Optical components Constituent parts Known failure mechanisms Failure modes Degradation factors Relevant tests References WDM (continued)Planar waveguide type (AWG, athermal AWG, interleaver)
Temperature controlDeterioration of electrical control Wavelength shift Mechanical stress High temperature High humidity
VibrationIEC 61300-2-1 Shock IEC 61300-2-9 Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22 Change of thermal resistance between waveguide and temperature control device
Wavelength shift Mechanical stress Thermal stress High temperature High humidityVibrationIEC 61300-2-1 Shock IEC 61300-2-9 Dry heatIEC 61300-2-18 Damp heatIEC 61300-2-19 Change of temperature IEC 61300-2-22
Ta bl e E 1 (1 2 of 20 ) Optical components Constituent partsKnown failure mechanisms Failure modes Degradation factors Relevant tests References WDM (continued)Fibre fused typeFixing point between fused part and substrate