Bsi bs au 243 3 1991 (1999) iso 7637 2 1990

BRITISH STANDARD BS AU 243 3 1991 ISO 7637 2 1990 Methods of test for Electrical disturbance by conduction and coupling — Part 3 Electrical transient conduction along supply lines only on commercial v[.]

Methods oftest for

This Bri sh Stan ard, ha ing

b en pre ared u der the

directon of the Automo ile

Stan ards Policy Commi e ,

was published u der the

authoriy of the Stan ards Bo rd

an comes into efect on

2 No emb r1 9

© BSI 0 -1 9

The folowing BSI references

relate to the work on this

stan ard:

Commi e reference AUE/16

Draft for comment 8 / 73 8 DC

ISBN 0 5 0 2 1 3 8

The prep ration of this British Stand rd was entrusted b the Automobi e

Stand rds Pol cy Commit e ( AUE/-) to Tech ical Commit e AUE/16, upon

which the fol owing bod ies were represented :

Association of Traier Man facturer

British Ca le Maker Confed eration

Dep rtment of Transport

Institution of Electrical Eng ine r

Motor Ind ustry Resear h Association

National Carav an Cou ci Ltd

Society of Motor Man facturer and Tra er Ltd

Am endm ents is ued sinc publ cation

Commit e s responsible Inside font cov er

5 General tech iq ues to improv e electromag netic comp tibi ity of d ev ice 9

Annex A ( normativ e) Faiure mode sev erity clas ification 10

Fig ure 1 — Conducted v oltag e transients measurement test setup 2

Fig ure 2 — Conducted cur ent transients measurement test setup 2

Fig ure 5 — |Z

P

| as a function of f eq uency fom10 kHz to10 MHz

National foreword

This British Stand ard has be n prep red u der the direction of the Automobie

Stand ards Pol cy Commit e and is identical with ISO7 3 -2 “R oa d vehicle —

Ele tr ica l d istur ba nc by cond ucton a nd couplng — Pa r t 2: Commer cia l vehicle

wi h nomina l 24 Vsup ly v la ge — Ele tr ica l tr a nsient cond ucton a long sup ly

lne only , publshed b the International Org anization for Stand ard ization

( ISO)

The Tech ical Commit e has rev iewed the prov isions of ISO 6 2 -3, to which

reference is ma e in the text an has d ecid ed that they are ac epta le for use in

conjunction with this stand ard

A British Stand ard d oes not purport to includ e al the neces ary prov isions of a

contract User of British Stand rd s are responsible for their cor ect a plcation

Com pl anc with a British Standard does not ofitself confer im m unity

f om leg al o l g ations

Sum mary of pag es

This document comprises a f ont cov er, an insid e font cov er, p g es i an i ,

p g es1 to 1 , an insid e b ck cov er and a b ck cov er

This stand rd has be n up ated ( se copy rig ht d ate) an ma hav e ha

amendments incorporated This wi l be ind icated in the amendment ta le on

theinside f ont cov er

1 Scope

This p rt of ISO 7 3 specifies test methods an

proced ures to ensure the comp tibi ty to conducted

electrical transients of eq uipment instaled on

commer ial v ehicles fit ed with a24 V electrical

sy stem It d es ribes bench tests for both the

injection and measurement of transients

Fu ctional status clas ifications for immu ity to

transients are g iv en inAnnex A

NOT General g uidelines for the e aluaton of transient

emis ions, test proced res for which are g iv n in clause 3, wil

form the subject of a future ad en um

The fol owing stand ard contains prov isions which,

throug h reference in this text, constitute prov isions

of this p rt of ISO7 3 At the time of publ cation,

the edition ind icated was v ald All stand rds are

subject to rev ision, and p rties to ag re ments b sed

on this p rt of ISO7 3 are encourag ed to

inv estig ate the pos ibi ity of a ply ing the most

recent edition of the stand rd ind icated below

Member of IEC and ISO maintain reg ister of

cur ently v ald International Stand rds

ISO 6 2 -3:19 4, R oa d vehicle — Uns r eened

low-tension ca ble — Pa r t 3: Cond ucto sizes a nd

d imensions

3 Test procedur s

3.1 General

Method s for measuring the transient emis ion on

sup ly l nes an test method s for the immu ity of

d ev ices ag ainst such transients are g iv en These

tests, cal ed “bench tests”, are ma e in the

la oratory

1)

The bench test method s, some of which require the

use of the artificial network, wi l prov id e

comp rativ e results betwe n la oratories They also

g iv e a b sis for the d ev elopment of dev ices and

sy stems and ma be used during the production

phase

A bench test method for the ev aluation of the

immu ity of a dev ice ag ainst sup ly l ne transients

ma be per ormed b means of a test pulse

g enerator; this ma not cov er al ty pes of transients

which can oc ur in a v ehicle Therefore, the test

pulses des ribed in4.6 are characteristic of ty pical

pulses

In special cases, it ma be neces ary to a ply

a d itional test pulses Howev er, some test pulses

ma be omit ed, if a d ev ice — depend ing on its

fu ction or its con ection — is not influenced b

comp ra le transients in the v ehicle.It is p rt of the

v ehicle man facturer’s responsibi ty to define the

test pulses required for a specific d ev ice

To ensure proper v ehicle operation in the

electromag netic env ironment, on-board testing is

es ential

3.2 Test tem perature and test v ltag e

The ambient temperature during the test shal

be23°C±5°C

The test v oltag es shal be as fol ows:

U

A

= 27 V ± 1 V

U

B

= 24 V ± 0,4 V

u les other v alues are ag re d upon b the user of

this p rt of ISO7 3 , in which case such v alues

shal be d ocumented in the test reports

3.3 Transient emis ions test

3.3.1 Voltage transients

V oltag e transients f om the disturb nce sour e,the

dev ice u d er test, are measured using the artificial

network to stand ardiz the imped ance loa ing on

the dev ice u der test ( se 4.1) The d isturb nce

sour e is connected v ia the artificial network to the

sh nt resistor R

s1 ( se 4.2), the switch S ( se 4.3)

and the power sup ly ( se 4.4), as g iv en in Fig ure 1

The lea s betwe n the terminals ofthe d isturb nce

sour e, the dev ice u der test, and the artificial

network shal be laid out in a straig ht p ralel lne

and shal hav e a leng th of0,5 m ±0,0 m

The ca le siz s shal be chosen in ac ord nce with

ISO 6 2 -3

The d isturb nce v oltag e is measured at the

terminals P an B of the artificial network

( se Fig ure 1) using a v oltag e probe an an

os i los ope or wav eform acq uisition eq uipment

Repetitiv e transients are measured with switch S

closed I the transient is caused b a sup ly

dis on ection, measurement is started at the

moment ofopening switch S

3.3.2 Cur ent transients

The test setup for measuring the d isturb nce

cur ent is shown in Fig ure 2

The d isturb nce sour e is con ected v ia the

artificial network to the power sup ly Resistor R

s2

( se 4.2) is con ected to the terminals of the

artificial network on the power sup ly side

( se Fig ure 2)

1)

A future p rt of ISO7 3 wil co er on-b ard v hicle tests

The lea s betwe n the terminals of the disturb nce

sour e and the artificial network shal be laid out in

a straig ht p ralel l ne and shal hav e a leng th

of0,5m ± 0,0 m

The disturb nce sour e is dis on ected b the

switch S

The disturb nce cur ent measurement is started

when switch S is opened

The disturb nce cur ent should be measured

betwe n the artificial network and the dev ice u d er

test as close to the artificial network as pos ible

3.4 Transient imm unity test

The test setup for transient immu ity

measurements of electrical/ electronic dev ices is

g iv en in Fig ure 3

The lea s betwe n the terminals of the test pulse

g enerator and the dev ice u der test shal be laid out

in a straig ht p ralel lne and shal hav e a leng th

of0,5m ±0,0 m

The test pulse g enerator ( se 4.6) is set up to prov ide

the specific pulse polarity , ampl tude, duration and

resistance with switch T ( se 4.3) open ( The

a propriate v alues are selected f om Annex A.)

Next, the d ev ice und er test is con ected to the

g enerator b closing switch T

Depend ing on the real conditions,the fu ction of the

d ev ice u der test should be ev aluated d uring and/or

after the a pl cation of the test pulses

Fig ure 1 — Conducted v ltag e transients m easurem ent test setup

Fig ure 2 — Conducted cur ent transients m easurem ent test setup

Fig ure 3 — Transient im m unity test setup

For cor ect g eneration of the req uired test pulses,it

ma be neces ary to switch the power sup ly on and

of The switching can be perormed b the test pulse

g enerator if the power sup ly is integ ral to it

4 Test instrument description a nd

specifica tions

4.1 Artificial network

The artificial network is used as a reference

stand ard in the la oratory in place of the imped nce

of the v ehicle wiring harnes in order to d etermine

the behav iour of eq uipment and electrical and

electronic d ev ices A s hematic diag ram is g iv en in

Fig ure 4

The artificial network should be a le to withstan a

contin ous load cor espond ing to the req uirements

of the d ev ice u d er test

The resulting v alues of imped nce |Z

P

|,measured

betwe n the terminals P and B whie terminals A

and B are con ected tog ether, are g iv en in Fig ure 5

as a fu ction of f eq uency as uming id eal electric

components In real ty , the imped nce of an

artificial network should not dev iate more

than10% f om the curv e g iv en in Fig ure 5

The main characteristic of the components are as

folows:

— max imum continuous load cur ent, I = 7 A

— ind uctance, L = 5 4 H ( air-core winding )

— internal resistance betwe n terminals P and A:

R

L

< 5m7

— ca acitor, C

2

= 0,1 4F for working v oltag es

of20 V

ac

and 15 0 V

d c

4.2 Shunt resistor R

s1 and R

s2

The sh nt resistor R

s1 ( se Fig ure 1) simulates the

dc resistance of other v ehicle d ev ices which are

connected in p ralel to the d ev ice u d er test and

are not dis on ected fom it b the ig nition switch

R

s1

is selected to cor espond to the resistance

measured on the wiring harnes betwe n the

dis on ected ig nition switch terminal an g rou d,

with the switch of, and shal be specified b the

v ehicle man facturer In the a sence of any

specification, a v alue of R

s1

= 4 7 shal be used I

a wire-wound resistor is used , the wind ing shal be

bifi ar ( i.e with a minimum reactiv e component)

Sh nt resistor R

s2 ( se Fig ure 2) is used d uring

cur ent transient measurements In the a sence of

any specification, a v alue of R

s2

=2 7 shal be used

The sh nt resistor shal hav e an a equate power

dis ip tion rating

4.3 Switch S and switch T

The switch S ( se Fig ure 1 and Fig ure 2)

sig nificantly influences the disturb nce transients

when tests are per ormed in ac ord ance with 3.2

NOT A sp cificaton for a swich S wih re rod cible

pro ertes is in pre araton In the interim i is pro osed to use a

stan ard prod cton swich that is used wih the de ice u der

test an to p rorm a suficient n mb r of tests to ensure a

statstcaly v lid sample

The switch T ( se Fig ure 3) is a d is on ecting switch

which do s not influence the d isturb nce transients

The cur ent rating of switch T should be suficient to

handle the req uired loa s

4.4 Power supply

W hen a b t ery is used, a charg ing sour e is ne ded

to achiev e the specified reference lev els

I a stand ard power sup ly ( with suficient cur ent

ca acity ) is used in bench testing to simulate the

b t ery , it is important that the low internal

imped ance of the b t ery also be simulated

The contin ous sup ly sour e shal hav e an internal

resistance R

i les than 0,01 7 dc an an internal

imped nce Z

i

= R

i for f eq uencies les than4 0 Hz

The output v oltag e shal not dev iate more than1 V

fr om0 to ma imum loa ( includ ing in-rush cur ent)

and shal recov er6 % of its ma imum excur ion

within10 4s The superimposed rip le v oltag e, U

r ,

shal not exce d0,2 V peak-to-peak and hav e a

ma imum feq uency of4 0 Hz

Fig ure 4 — Schematic diag ram of artificial

network

4.5 Measurem ent instrum entation

4.5.1 O sci los ope

This should prefera ly be a storag e os i os ope with

the folowing specifications:

— b nd wid th: at least10 MHz

— writing spe d : at least 10 cm/4s

— input sensitiv ity : at least 5 mV/div ision

The recording ma be mad e with an os i los ope

camera or any other a propriate recording dev ice

4.5.2 Voltage pr be:

— at en ation: 10 /1

— ma imum input v oltag e: at least 1 kV

— input imped nce, Z, as a fu ction of the

f eq uency , R:

— ma imum leng th of the probe ca le: 3 m

— ma imum leng th of the probe grou d: 0,13 m

NOT The leng ths wil influence the me surement results an

should b stated in the test re ort

4.5.3 Cur ent measuring pr be:

— minimum measuring rang e: 20 A

— ma imum working v oltag e: 5 0 V

— b nd width ( –3 dB): at least 0 to 15 MHz

( Hal efect probe)

— at en ator ac uracy: bet er than 3 %

4.5.4 Wavef rm acquisit ion equipment

Eq uipment that is ca a le of acq uiring fast rise

time transient wav eforms ma be used instead of an

os i os ope

4.6 Test pulse g enerator

The test pulse g enerator shal be ca a le of

prod ucing the test pulses d es ribed in4.6.1to4.6.7

and shal be ad justa le within the l mits g iv en in

Fig ure 6 toFig ure 13

Tolerances for the p rameter are

± 10 % for time an resistance, and

+ 10 % for v oltag e ( V

a and V

s )

Recommended v alues for the ev aluation of

immu ity of dev ices can be chosen f om Ta le A.1

4.6.1 Te t puls 1a and 1

This test pulse is a simulation of transients d ue to

sup ly dis on ection fom inductiv e load s; it a ples

to a dev ice u d er test if, as used in the v ehicle, it

remains con ected directly in p ralel with an

inductiv e loa

The pulse sha e and p rameter s are g iv en in

Fig ure 6

Fig ure 5 — |Z

P

| as a function off equency f om10 kHz to10 MHz (AB short- circuited)

4.6.2 Te t puls 2

This test pulse is a simulation of transients d ue to

the sudd en inter uption of cur ent in an inductor

con ected in series with a dev ice u der test

It simulates transients which ma for ex mple

oc ur d ue to the folowing : after the ig nition is

switched of, dc motor , which are con ected to the

same switch as the ig nition, ma continue rotating

due to their inertia, th s acting as g enerator Their

inductance c eates a transient on switching of the

sup ly l ne

The pulse sha e and p rameter are g iv en in

Fig ure 7

4.6.3 Te t puls s 3 and 3b

These test pulses are a simulation of transients,

which oc ur as a result of the switching proces es

The characteristic of these transients are

influenced b distributed ca acitance and

inductance of the wiring harnes

The pulse sha es and p rameter for test pulses 3

and 3 are g iv en in Fig ure 8 andFig ure 9

respectiv ely

NOT The tme neces ary b twe n the dis on ecton of the sup ly soure an the a plicaton of the test pulse, t

3 , shal b

minimized

Fig ure 6 — Test pulse 1a and 1b

Fig ure 7 — Test pulse 2

Fig ure 8 — Test pulse 3a

4.6.4 Te t puls 4

This pulse simulates sup ly v oltag e reduction

caused b energ izing the starter-motor cir uits of

internal combustion eng ines ( excluding spikes

as ociated with starting )

The pulse sha e and p rameter are g iv en in

Fig ure 10

Fig ure 9 — Test pulse 3b