Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 9 doc
Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 9 doc
... previous line widths. X-ray lithography may be a solu- tion for structure widths between 70 and 40 nm. Presumably, finer structures can- not be imaged. 7.3.7 Evaluation and Future Prospects The ... the wafer sur- face. Thus, by diffraction or interference effects resolution improvements in cor- ners, on points, and particularly with isolated lines can be obtained. The distribu- tion o...
Ngày tải lên: 12/08/2014, 02:23
Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 5 doc
... falsify the measurement. In some cases (e.g., when measuring an inhomogeneous doping process), one has to give up the advantages of the four-probe measurement, and the two-probe measurement ... the feed current and the applied voltage are meas- ured in only one pair of points. A correction factor between V / I and U is also needed. The pros and cons of the two-point measurem...
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Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 12 docx
... nipi SL (Fabry-Perot) 8.8 Page et al. [338] ( 199 9) GaAs/AlGaAs MQW (Fabry-Perot) pulsed >1 W (77 K) 9. 7 Hofstetter et al. [3 39] ( 199 9) GaInAs/AlInAs MQW (DFB) pulsed 80 mW (300 K) ... plasma at 90 0 °C. To give an idea of the dimensions of the device: the lengths of the white marks are 50 µm in Fig. 9. 19g and 2 µm in Fig. 9. 19h. Fig. 9. 18 Structure and electr...
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Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 14 pdf
... vol 294 , p 1317 397 . Hu J, Ouyang M, Yang P, Lieber CM ( 199 9) Controlled growth and electrical pro- perties of heterojunctions of carbon nanotubes and silicon nanowires. Nature, vol 399 , p ... 5–8, 199 3, p 705 296 . Asenov A ( 199 8) Random Dopant Threshold Voltage Fluctuations in 50 nm Epi- taxial Channel MOSFETs: A 3D “Atomistic” Simulation Study. ESSDERC 98 , Sep 8–10, 199...
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Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 8 pptx
... con- ductive channels from each other and hence really ensuring a quasi-one-dimen- sional current conduction is difficult. Besides, the zeolite material loaded with potassium is very reactive and ... production of one or quasi-one-dimensional electrical conduct- ing structures (1D nanowires) metal-loaded zeolites with suitable channel struc- tures are suggested as promising candidates [1...
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Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 10 pptx
... remain depleted be- tween the p and n regions. Therefore, a p-type line in a n-type area (e.g., a two- dimensional electron gas; 2DEG) works like two lateral anti-serial switched di- odes. Thus, ... Dimming and de- flecting voltages can range from some 10 to some 100 V and must be available as a wide-band (MHz to GHz) in order to achieve high dose accuracies and writing rates. Navig...
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Nanotechnology and Nanoelectronics - Materials, Devices, Measurement Techniques Part 11 ppt
... the STM 198 7 Nanostructuring (a) (b) Fig. 7.46 Measurement of a single 1,1'-dioctadecyl-3,3,3',3'-tetramethylindocarbocyanin molecule with a near-field probe. (a) Measurement ... the one hand. On the other hand, the ger- manium doping causes a modification of the band structure and enables an ex- Fig. 8.10 Cross section of a bipolar transistor, manufactured in self-...
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